产品详情
R2X0N1A0A1T0A处理器
功能与参数测试
1.<测试仪>对器件的检测,仅能反应出截止区,放大区和饱和区.但不
能测出工作频率的高低和速度的快慢等具体数值等.
2.同理对TTL数字芯片而言,也只能知道有高低电平的输出变化.而无
法查出它的上升与下降沿的速度.
四.晶体振荡器
1.通常只能用示波器(晶振需加电)或频率计测试,万用表等无法测量,
否则只能采用代换法了.
2.晶振常见故障有:a.内部漏电,b.内部开路c.变质频偏d.外围相连电
容漏电.这里漏电现象,用<测试仪>的VI曲线应能测出.
3.整板测试时可采用两种判断方法:a.测试时晶振附近既周围的有关
芯片不通过.b.除晶振外没找到其它故障点.
4.晶振常见有2种:a.两脚.b.四脚,其中第2脚是加电源的,注意不可随
意短路.
五.故障现象的分布
1.电路板故障部位的不完全统计:1)芯片损坏30%, 2)分立元件损坏30%,
3)连线(PCB板敷铜线)断裂30%, 4)程序破坏或丢失10%(有上升趋势).
2.由上可知,当待修电路板出现联线和程序有问题时,又没有好板子,既
不熟悉它的连线,找不到原程序.此板修好的可能性就不大了.
R2X0N1A0A1T0A处理器
| R2U0N1F1B1T0A |
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| R2U0N1C0A1T0F |
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| R2X0N1A1B1T0A |
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